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Four-probe, Low Temperature UHV AFM/STM
Four-probe, Low Temperature UHV AFM/STM for Nano-electronics and electron transport
Quadraprobe 
To meet the demands of advanced nano-electronics research, RHK provides the QuadraProbe, a sophisticated, four-probe, Low Temperature UHV AFM/STM system. The QuadraProbe is designed and outfitted to be the ideal platform for electrical measurements and electron transport studies on devices such as nano-wires and carbon nanotubes.

The system features a high resolution, integrated SEM, seven contact sample holders for heating and temperature measurement, RHK`s latest generation R9 controller, load lock and one or more prep-analysis chambers.

LT QuadraProbe Quick Specifications

  • Four smart probes: STM or AFM, interchangeable in vacuum
  • Each probe independently positionable and capable of atomic resolution
  • Chilled probes and sample as low as 4-6 K (LHe), 4. On-board SEM with up to 5 nm resolution
  • Integrated control system with single operator interface
  • Preparation-Analysis chamber standard
  • Unique specialty applications available: CL, microwave, magnetic field

Detailed technical specifications can be found on the RHK website