AFM CALIBRATION STANDARDS
Atomic Force Microscopy has become a valuable tool not only for visualization but also for performing accurate measurements on the nanometer and micrometer scale. In order to make the most of their measurement capabilities, AFM systems need to be properly calibrated.
We offer a range of calibration samples and tipcheck samples with different geometries for calibration of various aspects of the AFM scanner including:
- X, Y and Z axis calibration
- Determination of the tip aspect ratio
- Detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects
- Determination of tip shape
- Analysis of scanner bow