The NaioAFM is the ideal atomic force microscope for nanoeducation and small sample measurements.
This all-in-one AFM system provides solid performance and easy handling, with a price tag and
footprint that fit will anyone and any place.
- Integrated controller, airflow shielding, vibration isolation, and XY-table (12 mm)
- High resolution top view camera and side view sample observation built in
- Feature-complete: All standard operating modes available
- Simple cantilever exchange: no laser or detector adjustment required
- No system setup needed: just plug into your PC and start the software
- User-friendly software wizards quickly prepare measurement parameters
For further details please contact us on +44(0)1753 822522 or email@example.com