14 Nov New Conductive AFM Probes
NANOSENSORS announces new Wear Resistant Conductive Probe Series.
Windsor Scientific is please to announce that NANOSENSORS has developed a brand new innovative probes series of wear resistant and highly conductive AFM tips with an additionally slightly increased sharpness compared to metal coated AFM probes.
The new probes feature the best of both worlds of the most commonly used conductive probes: metal coated probes and probes with conductive diamond coating.
The probes are made of highly conductive platinum silicide which unites high conductivity (higher than conductive diamond coating and as good as metal coated tips) with a high wear resistance (much higher than metal coated probes and almost as good as diamond coated probes). Additionally the new PtSi probes have a slightly decreased tip radius compared to standard metal coated AFM probes.
Samples of the first types PtSi-NCH and PtSi-FM are already available. Conductive contact mode probes made of the new material will become available in the first half of 2012.
For more information please refer to: Platinum Silicide probes flyer or contact us at email@example.com