The Nanosurf LensAFM is an atomic force microscope that can be used as a normal objective lens on almost any optical microscope or profilometer. It greatly extends the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can be used to analyze various physical properties of a measurement sample as well.
Key features and benefits
Learn how the combination of atomic force and optical microscopy can improve your product or material surface analysis:
This webinar highlights: (A) ease of adaptation with multiple optical platforms, (B) synergy and convenience of combining optical and 3D topographical information in the same place, and (C) examples of industrial applications that have benefited from the combined platform.
Application areas: (A) topography information: roughness measurements, defect analysis, edge radius, step heights, (B) material property information: hardness, wear analysis, conductance/resistance, magnetism.
The Nanosurf LensAFM is an atomic force microscope (AFM) that may be used in conjunction with almost any upright optical microscope or optical profilometer. The combined LensAFM/optical platform provides a complementary imaging system that greatly extends the resolution and measuring capabilities of these individual instruments.