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LensAFM — AFM for optical microscopes

  • Mounts on virtually every upright optical microscope
  • Integrated motor for automated cantilever approach
  • Standard and extended AFM modes available
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Description

Extend the resolution of your upright microscope or 3D optical profilometer

The Nanosurf LensAFM is an atomic force microscope that can be used as a normal objective lens on almost any optical microscope or profilometer. It greatly extends the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can be used to analyze various physical properties of a measurement sample as well.

Key features and benefits

  • Mounts on virtually every upright optical microscope or 3D optical profilometer
  • Integrated motor for automated cantilever approach and engage
  • Standard and extended AFM modes available through a modular controller

General handling and working with the Nanosurf LensAFM

Learn how the combination of atomic force and optical microscopy can improve your product or material surface analysis:

 

Webinar: Advancements in instrumentation for surface inspection and defect analysis

 

 

This webinar highlights: (A) ease of adaptation with multiple optical platforms, (B) synergy and convenience of combining optical and 3D topographical information in the same place, and (C) examples of industrial applications that have benefited from the combined platform.

Application areas: (A) topography information: roughness measurements, defect analysis, edge radius, step heights, (B) material property information: hardness, wear analysis, conductance/resistance, magnetism.

The Nanosurf LensAFM is an atomic force microscope (AFM) that may be used in conjunction with almost any upright optical microscope or optical profilometer. The combined LensAFM/optical platform provides a complementary imaging system that greatly extends the resolution and measuring capabilities of these individual instruments.

Applications
  • Combining optical and AFM analysis
  • Extending the resolution of optical systems into the nanometer range
  • High-resolution defect analysis
  • Analysis where optical analysis fails
Components and Accessories
  • Advanced C3000 measurement modes
  • Stand-alone sample platform
  • Additional adapters for use on multiple microscopes