NaniteAFM — AFM for large samples

  • Compact and robust
  • Easy and quick cantilever exchange/alignment
  • Automated batch measurements
  • Easily mountable on custom stages
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Compact and mountable atomic force microscope for large-sample measurements

The unparalleled small footprint of the NaniteAFM scan head makes it the ideal atomic force microscope for integration into automated industrial environments. With a resolution below one nanometer, the NaniteAFM is capable of detecting and visualizing even the smallest surface structures. Simple handling and a multitude of integration possibilities bring your product analyses to a whole new level. Check coatings for intended structures or irregularities alike, measure surface roughness of treated or untreated materials, or use additional AFM measurement modes to detect features not visible in topography alone. Its ease of use and reproducibility make the NaniteAFM the perfect quality control tool for precision engineering, production process optimization, or semiconductor fabrication — just to name a few.

Key features and benefits

  • Compact and robust atomic force microscope for stand alone and large stage operation
  • Easy and quick cantilever exchange and alignment reduces downtime
  • Automated batch measurements and scripting interface for system integration

NaniteAFM on a large custom automated translation stage

Example of the NaniteAFM mounted on a large custom stage

  • Integration into other analysis systems
  • Automated or serial measurements
  • Large areas (also stitching)
  • Product development / quality control
Components and Accessories
  • Advanced C3000 measurement modes
  • Standard motorized stages
  • Custom translation stages
  • Isostage vibration isolation table